Symmetrization of Feature Points in 2-D Images

Authors

  • Alexander KARKİSHCHENKO
  • Valeriy MNUKHİN

DOI:

https://doi.org/10.18100/ijamec.85381

Keywords:

symmetrization; reflectional symmetry; rotational symmetry; feature points; biometrical identification

Abstract

In this work, we consider the symmetrization problem, that is the problem to obtain more accurate information about location of points based on a priori knowledge of their symmetries. Methods to solve the symmetrization problem with respect to vertical and inclined axes of reflectional symmetry are considered jointly with the more general symmetrization with respect to an indefinite reflection axis. Then the case of rotational symmetry is considered. The methods produce the minimal deformation that enhances approximate symmetries present in a given arrangement of points.

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References

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Published

21-10-2014

Issue

Section

Research Articles

How to Cite

[1]
“Symmetrization of Feature Points in 2-D Images”, J. Appl. Methods Electron. Comput., vol. 2, no. 4, pp. 49–53, Oct. 2014, doi: 10.18100/ijamec.85381.

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