verifiedOpen Access Peer-Reviewed Scientific Journal (CC BY 4.0)
Peer-Reviewed Academic JournalInternational Journal of Applied Methods in Electronics and Computers
ISSN: 3023-4409DOI Prefix: 10.58190/ijamec
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Vol. 13 • Issue 35 Published Articles

Volume 13, Issue 3 (2025)

Published: September 29, 2025

This issue of the International Journal of Applied Methods in Electronics and Computers (Vol. 13, No. 3, 2025) presents diverse and impactful studies that leverage machine learning, deep learning, and bibliometric methods across applications in natural language processing, agriculture, energy forecasting, and education analytics. Featured articles include a hybrid RNN-LSTM model tailored for sentiment analysis in Algerian dialectal social media content, a comparative study of SVM kernel functions for classifying date fruit varieties, and a bibliometric overview highlighting key trends in electricity load forecasting. The issue also explores the use of machine learning in predicting school dropout rates among international students in Türkiye, and introduces a hybrid deep learning approach combining Swin Transformer and EfficientNetV2 for maize variety classification.

Table of Contents

5 Articles • Full Text & Open Access
Research ArticlesverifiedPeer-ReviewedOpen Access
Pages: 50-57

Hybrid RNN-LSTM Architecture for Sentiment Analysis of Algerian Dialectal Social Media Content

Djalila BougharebfingerprintAmmar Chahir Menasri

Labstic Laboratory, Department of Computer Science, University of 8 Mai 1945, Guelma, Algeria; Department of Computer Science, University of 8 Mai 1945, Guelma, Algeria

Published: Oct 3, 2025|DOI: 10.58190/ijamec.2025.128
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Research ArticlesverifiedPeer-ReviewedOpen Access
Pages: 65-74

Trends and Research Directions in Electricity Load Forecasting: A Bibliometric Analysis

Oya KILCIfingerprintAbdulkadir OZTURKfingerprintMuslume Beyza YILDIZfingerprintSude Nur ATIKfingerprintElham Tahsin YASIN fingerprintZeki Berk TONGUÇ fingerprintMurat Koklufingerprint

Graduate School of Natural and Applied Sciences, Selcuk University, Konya, TURKIYE; Department of Computer Engineering, Selcuk University, Konya, TURKIYE

Published: Sep 30, 2025|DOI: 10.58190/ijamec.2025.130
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