verifiedOpen Access Peer-Reviewed Scientific Journal (CC BY 4.0)
Peer-Reviewed Academic JournalInternational Journal of Applied Methods in Electronics and Computers
ISSN: 3023-4409DOI Prefix: 10.58190/ijamec
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Pages: 49-53

Symmetrization of Feature Points in 2-D Images

Alexander KARKİSHCHENKO
Valeriy MNUKHİN
Publication DateOctober 21, 2014
Volume / IssueVol. 2, No. 4 (pp. 49-53)
DOI Identifier10.18100/ijamec.85381
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Abstract

In this work, we consider the symmetrization problem, that is the problem to obtain more accurate information about location of points based on a priori knowledge of their symmetries. Methods to solve the symmetrization problem with respect to vertical and inclined axes of reflectional symmetry are considered jointly with the more general symmetrization with respect to an indefinite reflection axis. Then the case of rotational symmetry is considered. The methods produce the minimal deformation that enhances approximate symmetries present in a given arrangement of points.
Keywords:symmetrization; reflectional symmetry; rotational symmetry; feature points; biometrical identification
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References (8)

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How to Cite This Article

A. K., V. M. (2014). Symmetrization of Feature Points in 2-D Images. International Journal of Applied Methods in Electronics and Computers, 49-53. https://doi.org/10.18100/ijamec.85381